Details of GSAS fit for Si 640d data aug14/11bmb_6098 # File no. = 6098 # No. steps = 34500 # Scan time = AUG 15, 2014 21:05 # Sample name = NIST SRM 640d (Si) # Composition = Silicon (Si) # Sample Comment = 0.8 mm dia Kapton # Temp (K) = 295.6 # 2theta step (deg) = 0.001 # Time per step (sec) = 0.1 # 100/Ring Current[0] = 1.004 # Monitor I0 [0] = 86940.6 # Monitor I1 [0] = 71229.8 # Gonio._radius [mm] = 1000.0 # Calibration file = 11bmb_6097_2thcorr.calib # 2Theta correction subtracted # Normalization factor = 7.8467 # Calibrated wavelength = 0.413848 5.43123(8) 5.4312(1) 5.4312(1) GSAS Fit Summary of 11-BM Si 640d Data # by Matthew Suchomel at APS/ANL, 2014 Using GSAS/EXPGUI ************************************** lattice a = 5.43120(1) (refined) SRM lattice a = 5.43123(8) A Delta lattice a from SRM = 0.00003 A (within SRM lattice error) Lambda = 0.413848 A (FIXED) Si X,Y,Z = 1/8, 1/8, 1/8 (FIXED) Si Uiso = 0.005 (refined) background = 6-term Shifted Chebyschev (type #1) GSAS Profile type 4 GU = 1.3 (refined) GV = -0.33 (refined) GW = 0.04 (refined) LX = 0.1 (FIXED; for SRN particle size of > 2 um) S1 = 5.263E-03 (refined) S2 = 5.626E-03 (refined) SH/L = 0.0011 (FIXED) 2th zero (deg) = 0.0006 (refined) Absorption (mR/L) = 0.0 (FIXED) Rwp % = 9.7% chi**2 = 3.4